Customized SNOM

• General information
• Key features
• Specification
• Applications

 

Fig.1 Customized SNOM



Fig.2 Measuring head on the stage

A unique system, specially designed for scanning near-field optical microscopy. The measuring head, XY positioning stage, both connected by the special adapter to the SPM controller, and the optical microscope are basic for the SPM complex. Device configuration gives an opportunity to unite the SNOM measuring heads with almost all optical microscopes by stage. To optimize approach process monitoring it is possible to mount, using external holder, closed circuit. Base case system consists of the SNOM measuring head, allowed to investigate the sufaces characteristics of a sample with resolution far beyond the diffraction limit. Use of the SNOM measuring head enables, besides the standard set of measurement modes, to implement optical modes.
Specialized motorized leg is approached the measuring head to the sample.

The device is intended for investigations of biological objects, nanooptical’s and integrally-optical elements, semiconductor structures and nanoelectronic elements, quality control of optical components surfaces .

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