SPM accessories

- GOLDEN silicon probes for contact/ semi-contact/ non-contact AFM
- Certified calibration gratings and test samples
- Super sharp DLC tips
- ETALON polysilicon cantilevers
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- 3
- 4

(287 Kb)

In Scanning Probe Microscopy, the perfect instrument is only half of the story. The probe is equally important. NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others. To keep your instrument properly calibrated, we carry an extensive array of test samples as well as multiple calibration gratings with free deconvolution software. And, to assure that we can offer you the most advanced probes to supplement our product line, now and in the future, we've made probe development a key component of our R&D program.
Exclusively from NT-MDT - the famous grating TGT1 for tip characterization, super sharp DLC tips and PTB-traceable certified gratings!

Detailed information is available at NT-MDT web shop, or from the company personal:

Head of the accessories sales department
Olga Safronova (olga@ntmdt.ru)

Sales support managers
Eugenia Grishina (grishina@ntmdt.ru)
Ekaterina Matveeva (matveeva@ntmdt.ru) Agne Mazgelyte (agne@ntmdt.ie)