Products

	NANOFAB 100 platform
	Complete cycle “development-research-production” within one system, for both micro- and nano-electronics. NanoFab combines modern techniques for semiconductor manufacturing (FIB, MBE, plasma etching) with today's most advanced analytical methods (SPM and TEM).
	NTEGRA platform
	The Ntegra is a revolutionary concept in SPM. It was designed specifically to form an SPM base platform for integration with cutting-edge analysis technologies such as spectroscopy and other leading analytical techniques. The NTEGRA allows the sample of interest to be studied by powerful and up-to-the-minute non-SPM methods without compromising SPM quality. It uniquely integrates SPM with optical observation, chemical composition mapping, and even nano-tomography, opening a new universe of correlative analyses applicable to all areas of modern science. Furthermore, its open architecture in hardware, software and signal integration provides a portal for you to customize and expand this list to fit your applications.
	SOLVER platform
	For experiments confined to just Scanning Probe Microscopy, the Solver line of instruments is an excellent choice. Providing most of the modern AFM and STM techniques, including a number unique to NT-MDT, the time proven Solvers offer today's best price/quality ratio.
	NANOEDUCATOR platform
	We believe that future scientific breakthroughs have their origins in the present. Following that truth, we have developed a special student-orientated product: NANOEDUCATOR. More than a simple SPM, NANOEDUCATOR opens the door to nanotechnology education. We've designed it to be cost effective enough to equip a classroom with SPMs, complete with e-teach software, handbooks, and descriptive laboratory exercises - all the materials necessary to teach students crucial skills in nanotechnology.
	SPM accessories
	In Scanning Probe Microscopy, the perfect instrument is only half of the story. The probe is equally important. NT-MDT offers a wide assortment of SPM probes, ranging from the routine to ultra-sharp tips of silicon or diamond-like carbon, probes with different coatings, probes for SNOM, for magnetic measurements, and many others. To keep your instrument properly calibrated, we carry an extensive array of test samples as well as multiple calibration gratings with free deconvolution software. And, to assure that we can offer you the most advanced probes to supplement our product line, now and in the future, we've made probe development a key component of our R&D program.