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Universal measuring head with IR laser: Key features

  • Wide range of SPM methods
  • Use of the set of specialized adjusting stages for easing the process of alignment
  • Availability an optic system for detection of the bending of a cantilever, including IR laser and four-section photodiode
  • Capability of investigation of different samples even visible-light-sensitive
  • High spatial resolution provided by effective combination of active and passive vibration isolation
SPM is now available
for MAC OS users
Get the first app for Nano
from the iTunes App Store
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