Size: 6x6 um
Example of Confocal Raman Microscopy images. Ge dots on the surface of Si. Left image obtained at characteristic line of Ge (412 cm-1), the right one obtained at main Si line (520 cm-1). Note that dark areas on the right image correspond to bright areas on the left one (arrows), as the Si signal cannot reach from beneath the Ge particles.
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Name: Ge dots
Example of Confocal Raman Microscopy images. Ge dots on the surface of Si. Left image obtained at characteristic line of Ge (412 cm-1), the right one obtained at main Si line (520 cm-1). Note that dark areas on the right image correspond to bright areas on the left one (arrows), as the Si signal cannot reach from beneath the Ge particles. |
