Size: 20x20 um
Frequency: 719
AFM topography (left) and AFAM (right) images of polyethylene chrystals on mica substrate. AFAM image shows higher contrast and reveal fine structure details that
are not detectable by AFM.
Sample courtesy of Dr. Joahim Loos, Dutch Polymer Institute,
Eindhoven, Netherlands.
|
Name: Polyethylene crystals (AFAM)
AFM topography (left) and AFAM (right) images of polyethylene chrystals on mica substrate. AFAM image shows higher contrast and reveal fine structure details that
are not detectable by AFM.
Sample courtesy of Dr. Joahim Loos, Dutch Polymer Institute,
Eindhoven, Netherlands.
|
