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SPM Principles
SPM Basics
1. Scanning Tunnel Microscopy (STM)
2. Scanning Force Microscopy (SFM)
3. Scanning Optical Microscopy
4. Flash models
SPM Glossary
SPM Basics
1. Scanning Tunnel Microscopy (STM)
1.1 STM Physical Backgrounds
1.2 Tunnel Current in MIM System
1.3 "Observed" Physical Quantities in STM
2. Scanning Force Microscopy (SFM)
2.1 Cantilever
2.2 Cantilever-Sample Force Interaction
2.3 Linear Oscillations of Cantilever
2.4 Non-linear Oscillations of Cantilever
2.5 Ultimate Resolution in Contact Mode
2.6 Probe-Sample Interaction: Lateral Forces
2.7 Magnetic Force Microscopy: Quantitative Results Treatment
3. Scanning Optical Microscopy
3.1 "Classical" Optical Microscopy
3.2 Confocal Microscopy
3.3 Scanning Near-Field Optical Microscopy (SNOM)
4. Flash models
4.1 Nanotribology
4.2 Microtribology
4.3 Nonlinear oscillations
4.4 Interaction between magnet probe and wire
4.5 Interaction between probe and parallel periodic domens
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