SPM Basics

• 1. Scanning Tunnel Microscopy (STM)
  • 1.1 STM Physical Backgrounds
  • 1.2 Tunnel Current in MIM System
  • 1.3 "Observed" Physical Quantities in STM
• 2. Scanning Force Microscopy (SFM)
  • 2.1 Cantilever
  • 2.2 Cantilever-Sample Force Interaction
  • 2.3 Linear Oscillations of Cantilever
  • 2.4 Non-linear Oscillations of Cantilever
  • 2.5 Ultimate Resolution in Contact Mode
  • 2.6 Probe-Sample Interaction: Lateral Forces
  • 2.7 Magnetic Force Microscopy: Quantitative Results Treatment
• 3. Scanning Optical Microscopy
  • 3.1 "Classical" Optical Microscopy
  • 3.2 Confocal Microscopy
  • 3.3 Scanning Near-Field Optical Microscopy (SNOM)
• 4. Flash models
  • 4.1 Nanotribology
  • 4.2 Microtribology
  • 4.3 Nonlinear oscillations
  • 4.4 Interaction between magnet probe and wire
  • 4.5 Interaction between probe and parallel periodic domens