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SPM Principles
SPM Basics
1. Scanning Tunnel Microscopy (STM)
2. Scanning Force Microscopy (SFM)
2.1 Cantilever
2.1.1 The Hooke's law
2.1.2 Deflections under the vertical (normal) force component
2.1.3 Deflections under the longitudinal force
2.1.4 Deflections under the transverse force
2.1.5 Cantilever inverse stiffness tensor
2.1.6 Effective mass and eigenfrequency of the cantilever
2.2 Cantilever-Sample Force Interaction
2.3 Linear Oscillations of Cantilever
2.4 Non-linear Oscillations of Cantilever
2.5 Ultimate Resolution in Contact Mode
2.6 Probe-Sample Interaction: Lateral Forces
2.7 Magnetic Force Microscopy: Quantitative Results Treatment
3. Scanning Optical Microscopy
4. Flash models
SPM Glossary
2.1 Cantilever
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2.1.1 The Hooke's law
2.1.2 Deflections under the vertical (normal) force component
2.1.3 Deflections under the longitudinal force
2.1.4 Deflections under the transverse force
2.1.5 Cantilever inverse stiffness tensor
2.1.6 Effective mass and eigenfrequency of the cantilever
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