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SPM Principles
SPM Basics
1. Scanning Tunnel Microscopy (STM)
2. Scanning Force Microscopy (SFM)
2.1 Cantilever
2.2 Cantilever-Sample Force Interaction
2.2.1 Cantilever-sample interaction potential. AFM operation modes
2.2.2 Elastic interactions. The Hertz problem
2.2.2.1 The Hertz problem definition
2.2.2.2 The Hertz problem solution
2.2.2.3 Exact Hertz problem definition and its solution in a general form
2.2.2.4 The effect of elastic deformations during experiment
2.2.2.5 Appendices
2.2.3 Capillary forces
2.2.4 The Van der Waals force
2.2.7 Adhesion forces
2.3 Linear Oscillations of Cantilever
2.4 Non-linear Oscillations of Cantilever
2.5 Ultimate Resolution in Contact Mode
2.6 Probe-Sample Interaction: Lateral Forces
2.7 Magnetic Force Microscopy: Quantitative Results Treatment
3. Scanning Optical Microscopy
4. Flash models
SPM Glossary
ProIMAGE Contest
2.2.2 Elastic interactions. The Hertz problem
2.2.2.1 The Hertz problem definition
2.2.2.2 The Hertz problem solution
2.2.2.3 Exact Hertz problem definition and its solution in a general form
2.2.2.4 The effect of elastic deformations during experiment
2.2.2.5 Appendices
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