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2. Scanning Force Microscopy (SFM)
2.6 Probe-Sample Interaction: Lateral Forces
- 2.6.1 The nature of frictional forces
- 2.6.2 Cantilever deformations under the influence of lateral forces
- 2.6.3 Calibration of the optical detection system
- 2.6.4 Qualitative interpretation of results
- 2.6.5 Stick-slip motion on the nanoscale
- 2.6.6 Stick-slip phenomenon on the microscale
- 2.6.7 Appendices
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