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SPM Principles
SPM Basics
1. Scanning Tunnel Microscopy (STM)
2. Scanning Force Microscopy (SFM)
2.1 Cantilever
2.2 Cantilever-Sample Force Interaction
2.3 Linear Oscillations of Cantilever
2.4 Non-linear Oscillations of Cantilever
2.5 Ultimate Resolution in Contact Mode
2.6 Probe-Sample Interaction: Lateral Forces
2.7 Magnetic Force Microscopy: Quantitative Results Treatment
2.7.1 MFM general concept
2.7.2 Algorithms for the physical parameters of the sample obtaining
2.7.3 Interaction of the hard magnetic cantilever with the magnetic field of the studied sample (general case)
2.7.4 Dipole effective magnetic moment approximation
2.7.5 Effective monopole magnetic charge approximation
2.7.6 Interaction between soft magnetic probe and magnet sample
2.7.7 Interaction between paramagnetic probe and magnet sample
2.7.8 Methods of magnet probe parameters estimation
2.7.9 Magnetic field of rectangular conductor with current
2.7.10 Magnetic field of ring with current
2.7.11 Magnetic field of cylinder domains
2.7.12 Magnetic field of periodic parallel domains
3. Scanning Optical Microscopy
4. Flash models
SPM Glossary
2.7 Magnetic Force Microscopy: Quantitative Results Treatment
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2.7.1 MFM general concept
2.7.2 Algorithms for the physical parameters of the sample obtaining
2.7.3 Interaction of the hard magnetic cantilever with the magnetic field of the studied sample (general case)
2.7.4 Dipole effective magnetic moment approximation
2.7.5 Effective monopole magnetic charge approximation
2.7.6 Interaction between soft magnetic probe and magnet sample
2.7.7 Interaction between paramagnetic probe and magnet sample
2.7.8 Methods of magnet probe parameters estimation
2.7.9 Magnetic field of rectangular conductor with current
2.7.10 Magnetic field of ring with current
2.7.11 Magnetic field of cylinder domains
2.7.12 Magnetic field of periodic parallel domains
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