2.2.4.3 Appendices

1.    Parabolic or spherical probe.

The model applies to probes with a spherical tip at small tip-sample separations . The same result is obtained generally for the parabolic tip.

(1)

In AFM measurements with silicon probe and sample at , , : .

---

2.    Conical probe.

The model applies in case when tip curvature radius can be neglected as compared to tip-sample separation ().

(2)

In AFM measurements with silicon probe and sample at , , : .

---

3.    Pyramidal probe.

The model applies in case when tip curvature radius can be neglected as compared to tip-sample separation ().

(3)

In AFM measurements with silicon probe and sample at , , : .

---

4.    Conical probe with a rounded tip.

The model is a generalization of (1) and (2) at arbitrary ratio between and .

(4)

where . At (semispherical probe) formula (4) transforms into formula (1) while at (conical probe) – into formula (2).

In AFM measurements with silicon probe and sample at , , : .