SPM Glossary

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Maxwell-stress microscopy

The advantage of Maxwell-stress microscopy comes from the use of the second-harmonic electric-field-induced oscillation of the cantilever for controlling the tip-surface distance. This scheme automatically establishes a point of reference for electrical measurements in terms of the tip-surface capacitance, thereby insuring that the observed contrast is always free from the influences of the sample topography.
J. Vac. Sci. Technol. B 14, 2105 (1996).

MDTA, mDTA

Micro Differential Thermal Analysis

MFM

Magnetic Force Microscopy
Appl. Phys. Lett. 50, 1455 (1987).
Manipulation Force Microscopy The manipulation force microscope is a novel atomic force microscope adapted to measuring the force necessary to displace micron-size samples adhering to surfaces. It has successfully characterized the adhesion of both proteins and living cells to substrates. This instrument enables measurement of samples not previously accessible to atomic force microscopes.
Rev. Sci. Instrum. 70, 2769 (1999).

MFP

Molecular Force Probe

mode

an attempt of SPM operation modes systematisation.

MRFM

Magnetic Resonance Force Microscopy.

MSTM

Magnetic STM
Phys. Rev. Lett. 79, 4593-4596 (1997).

MTMA, m TMA

Micro-Thermo Mechanical Analysis
Micro-Thermo Mechanical Analysis (µTMA) senses changes in a material's mechanical properties by monitoring probe displacement as a function of temperature.