Basics

Topography acquisition. ZnBeMgSe/GaAs laser structure.

    References

1. A. V. Ankudinov, A. N. Titkov, T. V. Shubina, S. V. Ivanov, P. S. Kop'ev, H.-J. Lugauer, G. Reuscher, M. Keim, A. Waag, G. Landwehr, Applyed Physics Letters, October 1999, Volume 75, Number 17, pp. 2626-2628, "Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgSSe-based laser diodes". (pdf-file).

AFM images are obtained by commercial SPM P4 with NSG11 cantilevers.
Additional information about laser structures were received with usage of Contact EFM, Kelvin mode.