Practice details

Topography acquisition. ZnBeMgSe/GaAs laser structure.
 

See practice details of topography acquisition, ZnSSe/GaAs laser structure.

Specific parameters of the scan can be found in f2.opt, f5.opt and f2.mdt, f5.mdt.

    References

1. A. V. Ankudinov, A. N. Titkov, T. V. Shubina, S. V. Ivanov, P. S. Kop'ev, H.-J. Lugauer, G. Reuscher, M. Keim, A. Waag, G. Landwehr, Applyed Physics Letters, October 1999, Volume 75, Number 17, pp. 2626-2628, "Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgSSe-based laser diodes". (pdf-file).

AFM images are obtained by commercial SPM P4 with NSG11 cantilevers.
Additional information about laser structures were received with usage of Contact EFM, Kelvin mode.