SPM Principles

• STM techniques
  • Constant Current mode
  • Constant Height mode
  • Barrier Height imaging
  • Density of States imaging
  • I(z) Spectroscopy
  • I(V) Spectroscopy
• AFM
  • dc Contact techniques
    • Constant Height mode
    • Constant Force mode
    • Contact Error mode
    • Lateral Force Imaging
    • Spreading Resistance Imaging
    • Contact Scanning Capacitance Microscopy
  • ac Contact techniques
    • Force Modulation mode
    • Contact EFM
    • AFAM
    • AFAM Resonance Spectroscopy
    • Piezoresponse Force Microscopy
  • Semicontact techniques
    • Semicontact mode
    • Phase Imaging mode
    • Semicontact Error mode
  • Non-Contact techniques
    • Non-Contact mode
    • Frequency Modulation mode
  • Many-pass techniques
    • EFM
    • Scanning Capacitance Microscopy
    • Kelvin Probe Microscopy
    • DC MFM
    • AC MFM
    • Dissipation Force Microscopy
• Spectroscopies
  • Force-distance curves
  • Adhesion Force imaging
  • Amplitude-distance curves
  • Phase-distance curves
  • Frequency-distance curves
  • Full-resonance Spectroscopy
• SNOM
  • Shear Force Microscopy
  • Transmission mode
  • Reflection mode
  • Luminescence mode
  • SNOM Lithography
• aSNOM techniques
  • Scanning Plasmon Near-field Microscopy
• Lithographies
  • AFM Oxidation Lithography
  • STM Lithography
  • AFM Lithography - Scratching
  • AFM Lithography - Dynamic Plowing
• Confocal Microscopy techniques
  • Laser mode
  • Image mode
  • Spectral mode
  • Confocal Volume Lithography