Part 1. Step 1. Scanning by Probe

Part 1. Step 2. Scannig by Sample

Part 1. Step 3. Dual Scan™ Mode

Probe NanoLaboratories

Part 2. Step 1. SC203NTF - Scanner 3x3x2.6 um

Part 2. Step 2. SC210NTF - Scanner 10x10x4 um

Part 2. Step 2. SC250NTF - Scanner 50x50x6 um with sensors

Part 3. Step 1. SF005NTF - Universal SPM head for NFT

Part 3. Step 2. AU006NTF/AU007NTF - Adjustment units for Contact and Resonant AFM

Part 3. Step 3. AU020NTF - Adjustment unit for low current measurements

Part 3. Step 4. AU028NTF - Adjustment unit with special liquid cell

Part 4. Step 1. SFC050NTF - Universal SPM scanning head with sensors

Part 4. Step 2. SFC050LNTF/SFC100LNTF and MP3L/MP4L - SPM scanning head for basic AFM modes in liquid

Part 4. Step 4. SUT01NTF - Thermohead and Heating stage with built in scanner

Part 4. Step 3. ST007NTF - STM head with preamplifier (30pA - 50nA)

Part 4. Step 5. SNLG100NTF - Shear Force (SNOM) scanning head with quartz detector

Part 5. Step 1. XYZ01NTF - X,Y,Z closed-loop equivivalent scanner

Part 5. Step 2. AFAM03NTF - AFAM acoustic transducer

Part 6. Step 1. SU045NTF - Sample holder with heating stage (up to 150C)

Part 6. Step 2. SU005NTF - Sample holder with heating stage (up to 300C)

Part 7. Step 1. CCD05o - Videomicroscope with manual zoom.

Part 8. Step 1. TS150 - The dynamic vibration isolation system. JRS Scientific Instruments, Germany