AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM



Planned Webinars

Archived Webinars

Dr. Pavel Dorozhkin (NT-MDT), Dr. Mark Wall (Thermo Fisher Scientific)

Integrated Raman Atomic Force Microscopy - A Powerful Technique for the Comprehensive Understanding of Materials

The study of materials has greatly benefited from Atomic Force Microscopy (AFM). This surface technique reveals important insight into the electronic, mechanical, magnetic, and topographical properties of materials at the micro and nanoscale. Raman microscopy provides detailed molecular information that complements the information uncovered by AFM. This webinar will discuss the fundamentals of AFM and Raman microscopies, how they are practiced and the information they bring to the understanding of materials. Following this, a detailed discussion will focus on how tightly integrating Raman and AFM instrumentation together brings important added benefits to the characterization of materials.

    Date: Thursday, August 27,  2015
    Session 1: 9 a.m. (EDT)
    Session 2: 12 p.m. (EDT)

   Click here to register


Dr. Sergei Magonov

New Developments in AFM Oscillatory Resonance Modes: Frequency Imaging and Frequency Modulation

The webinar took place on 28 May 2015

Presentation of  webinar   (4 Mb)  

Please click here to view recording of the webinar

Dr. Stanislav I. Leesment

Basic Principles of AFM Advanced Modes & Applications

The webinar took place on 18 March 2015
Dr. Sergei Magonov

High-Resolution and Quantitative AFM Mapping of Mechanical Properties of Polymers

The webinar took place on 12 February 11am MST

Presentation of webinar  (6 Mb)  

Please click here to view recording of the webinar


Webinar Synopsis:

An extraction of mechanical properties from force curves in Atomic Force Microscopy (AFM) was originally suggested in 1989. Since then this capability has been developed tremendously, and it can be further broadened to address complex material behavior. Among the main AFM operations the recording of force curves in non-resonant oscillatory mode such as HybriD™ mode offers the most advanced mapping of mechanical properties. Fast recording and on-line analysis of the force-versus-time and force-versus-penetration dependencies in terms of solid state deformation models (Hertz, DMT, JKR, Oliver-Pharr, etc) allows simultaneous imaging of surface structures and quantitative mapping of their elastic modulus and work of adhesion. The practical results, which are obtained on samples of neat polymers, polymer blends and block copolymers, will be illustrated by the modulus and adhesion maps with a data density of 512x512 pixels and higher. A particular emphasis will be made on mapping of the mechanical properties of polymer materials in the sub-100 nm scale with a spatial resolution of 10 nm. 


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