AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM



Planned Webinars

Archived Webinars

Dr. Stanislav I. Leesment

Basic Principles of AFM Advanced Modes & Applications

The webinar took place on July 16, 2014.

Presentation of webinar  (7.2 Mb)

Please click here to view recording of the webinar

The webinar cover the following topics:

·         Physical principles of Atomic Force Microscopy  –  contact and noncontact/semicontact modes, Phase, Amplitude (Feedback Error)

·         Choice of the cantilever

·         High resolution

·         Spreading resistance imaging (Conductive AFM/Current mapping)

·         Kelvin Probe Microscopy (KPM), single and double pass

·         Piezoresponse Force Microscopy (PFM)

·         Magnetic Force Microscopy (MFM)

·         Nanolithography mechanical and electrical, Vector and Raster

·         HybriD™ Mode, the future of the Atomic Force Microscopy.

This should help in terms of getting the results you require from your application of AFM within research parameters and help to crystallise some of the principles that are being taught within your institutions.

Dr. Pavel Dorozhkin

Beyond the Diffraction Limit: AFM Integration with Light

AFM-Raman-SNOM-TERS_2014  (9.6 Mb)
Watching original webinar recording (~50 min) is highly recommended rather than looking at this PDF.
On the original recording you will be able to see unique videos of TERS, SNOM and AFM-Raman experiments.

Please click here to view recording of the webinar

In this webinar we will present exciting recent applications and instrumentation developments in the field of AFM integration with optics aimed for super-resolution optical imaging. The material presented will include:

  • Tip Enhanced Raman Scattering (TERS, “nano-Raman”)
    • ~10 nm resolution hyper-spectral chemical and structural imaging of: DNA, graphene, semiconductors, polymers, molecular monolayers, lipid membranes, various protein structures etc.
    • Reliable probes for reproducible nano-Raman
    • Instrument optimization for easy setting up of the TERS experiment and fast mapping
    • Universal optical access to the AFM probe: from Top, Bottom and Side; UV – VIS – IR wavelength ranges.
  • Scanning Near-field optical microscopy (SNOM)
    • Aperture and apertureless (s-SNOM) techniques for optical resolution down to 50 nm and less
    • Plasmonic structures, photonic crystals and waveguides, lasers, optical fibers, focusing elements etc.
    • New generation of SNOM probes and new measuring modes
  • Co-localized AFM and optical imaging (diffraction limited)
    • Co-localized AFM-Raman imaging; including Hybrid AFM measuring mode for quantitative nano-mechanics
    • AFM with confocal microscopy & fluorescence lifetime (FLIM) microsopy

We will show the advantages and limitations of each technique when applied to various samples. Review sample and probe preparation issues and give an overview of how your specific research can benefit from each technique.

Informaton on NT-MDT AFM-Raman-SNOM technology can be found here: http://www.ntmdt.com/afm-raman



Dr. Sergei Magonov

TITANIUM - the revolutionary step in AFM design

It’s time for an AFM cantilever Revolution! NT-MDT - Your AFM & Raman Company invites you to join our upcoming webinar about the TITANIUM Atomic Force Microscope and be first to learn about this revolutionary step in AFM design – Multiprobe Cartridge.

Our presenter will be Dr. Sergei Magonov.

Dr. Magonov received a doctorate in physics and mathematics from the Moscow Institute of Physics and Technology. Sergei has published over 200 peer-reviewed papers, 1 book, and 15 book chapters. He is now CEO of NT-MDT Development, an R&D subsidiary that was established for the development of novel experimental and applications capabilities using NT-MDT microscopes.

Who should attend? Materials Scientists, Physicists, Engineers, and Chemists interested in:

  • Breakthrough low thermal drift
  • High resolution imaging
  • Multiprobe AFM cantilevers
  • Automated AFM measurements
  • Advanced imaging techniques (HybriD, multi-frequency…)

AFM imaging with the Multiprobe Cartridge has been successfully applied in variety of applications. AFM usability has been enhanced to users of all skill levels. The revolutionary development in Atomic Force Microscopy – Multi-probe Cartridge - will be presented to show its advantages for the streamlined usability of TITANIUM AFM.

Recent achievements in high resolution imaging will be presented by examples obtained on different samples (polymers, composites, biomaterials, metals, semiconductors). The presented results were obtained in variety of modes (Amplitude Modulation, HybriD, single-pass Kelvin Force Microscopy, etc) with the use of different multi-frequency approaches. The essential issues of such studies related to spatial resolution, system noise and drift performance requirements will be discussed.

Copyright © 1998 - 2014, NT-MDT