Atomic Force Microscopes for Nanotechnology, Scientific Research & Education

AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM

NTEGRA Spectra

Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)

Solver Nano

Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education

HybriD Mode™

New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra, SPECTRUM and LIFE systems

TERS probes for nano-Raman imaging

AFM-Raman-TERS-SNOM instrumentation

•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS


Versatile automated AFM-Raman, SNOM
and TERS system
Versatile automated AFM-Raman, SNOM and TERS system


Automated AFM-Raman-SNOM system for a wide range of applications

Columbus Convention Centre, Columbus, OH. July, 24-28, 2016

East Midlands Conference Centre, Nottingham, UK. July, 25-29, 2016

Convention & Exhibition Centre, Torremolinos (Malaga), Spain. July, 25-28, 2016

Technische Universität Darmstadt, Germany. August, 21-25, 2016
Unique cantilever-type TERS probes for
nano-Raman imaging

Record Raman enhancement factors, highest nano-Raman spatial resolution and excellent AFM performance. Read more
Image of TERS probe
New ETALON series AFM probes with CoFe coating for ultra-high-resolution MFM
3x3 um AC-MFM image of high-density HDD surface reveals at least 30 nm resolution.
Read more
MFM image of HDD
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