Atomic Force Microscopes for Nanotechnology, Scientific Research & Education

TITANIUM
AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM

NTEGRA Spectra

Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)

Solver Nano

Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education

HybriD Mode™

New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra, SPECTRUM and LIFE systems

TERS probes for nano-Raman imaging

Dedicated
AFM-Raman-TERS-SNOM instrumentation

•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS

NTEGRA Spectra II

Versatile automated AFM-Raman, SNOM
and TERS system
Versatile automated AFM-Raman, SNOM and TERS system

SPECTRUM

Automated AFM-Raman-SNOM system for a wide range of applications
 
 

Technische Universität Darmstadt, Germany. August, 21-25, 2016

Changchun, China. August, 26-30, 2016

Russia, Ekaterinburg, Institute of Natural Sciences UrFU. August, 27-29, 2016

Trinity College Dublin, Ireland. August 31 - September 3, 2016

Poland,Warsaw. September, 19-22, 2016
 
NTEGRA Spectra II
Versatile automated AFM-Raman, SNOM and TERS system

High-performance versatile
automated AFM-Raman, SNOM and TERS system with top, side and bottom optical access. Read more
 

NTEGRA Spectra II 3D overview
 
 
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