Atomic Force Microscopy for Nanotechnology, Scientific Research & Education
|AFM - Raman - SNOM||Bio AFM||Modular AFM||Automated AFM||Practical AFM|
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
other properties within a single scan
Compatible with: NEXT, NTEGRA Prima, NTEGRA Spectra,
SPECTRUM and LIFE systems
integrated with Inverted Light Microscope
for Biological Research
Hongkong. December, 20-22, 2013
Dubai International Exhibition Center. March, 17-20, 2014
France, Toulouse. May, 6-9, 2014
Processing of AFM images in Image Analysis software
Image processing and presentation tools will be introduced within the scope of webinar.
Speaker: Chief of Software Development Group, Stanislav Leesment, Ph.D.
Please register below to receive invitation to the webinar.
HybriD Mode™ - Innovative Atomic Force Microscopy technique
Innovative Atomic Force Microscopy HybriD Mode™ provides comprehensive information about your sample.
Morphological, mechanical, chemical, electrical, magnetic, and other characteristics are resolved within single measurement cycle with high spatial resolution.